功能 Characteristics: ◆ 常溫下測(cè)量的參數(shù) Parameters measured under normal temperature: 放大倍數(shù)β(0~99) 開(kāi)關(guān)時(shí)間 Switching time T (0.01μs~99.9μs),包括上升時(shí)間,存儲(chǔ)時(shí)間,下降時(shí)間 including Tr,Ts,Tf 飽和壓降VCES (0~2V),正向壓降VBE (0~2V) 漏電流 Leakage current ICEO (0.1μA~3mA) 耐壓 Withstand voltage BVCEO (50V~650V) ◆ 高溫下測(cè)量的參數(shù) Parameters measured under high temperature: β, VBE, ICEO ◆ 對(duì)比常溫和高溫下的兩次測(cè)量結(jié)果,對(duì)β、VBE、ICEO 三項(xiàng)參數(shù)變化量超過(guò)一定范圍的管子以聲光報(bào)警,予以剔除 Compare the results of β, VBE , ICEO measured in normal and high temperature, the selector will alarm to those variations exceed the preset limits so that operators can pick them out ◆ 對(duì)T、β進(jìn)行分檔,可顯示批號(hào);對(duì)VCES、VBE、 ICEO、BVCEO 及熱敏參數(shù)進(jìn)行超限判斷,不合格的聲光報(bào)警, 并指示不合格項(xiàng) Pre-set grouping values for T & β, selector can display group number and alarm when measured values of VCES, VBE, ICEO and BVCEO exceed the limits, meanwhile indicating the unqualified item ◆ 測(cè)試條件可按要求自由調(diào)節(jié)或設(shè)定 Freely adjusting or setting of test conditions according to requirement A. β測(cè)試 β testing: Ib 注入電流有三檔 three different Ib current: 0.1mA, 1mA, 10mA B. 開(kāi)關(guān)時(shí)間測(cè)試 Switching time test: Ic 電流有四檔 4 different Ic current: 0.5A, 0.25A, 0.1A, 0.05A 對(duì)應(yīng) Ib 電流為 the corresponding current Ib: 0.1A, 0.05A, 0.02A, 0.01A C. 對(duì)晶體管加熱條件 Heating condition for transistor: 加熱電壓 Heating voltage: 5~20V 連續(xù)可調(diào) continuously adjustable 加熱時(shí)間 Heating time: 0~9.9s 連續(xù)可調(diào) continuously adjustable ◆ 分檔、超限判斷可自由設(shè)定,掉電自動(dòng)保存,儀器能夠同時(shí)保存20組數(shù)據(jù),使用時(shí)只要調(diào)出其中一組即可 Grouping values and limit values freely set, with automatically saving function in case of power cut; the instrument can save 20 different settings, choose one setting when using ◆ 四窗口數(shù)字顯示所測(cè)數(shù)據(jù),讀數(shù)直觀,可打印所測(cè)數(shù)據(jù) 4 windows for displaying measured values, easy to read, and printable